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Ellipsometry Set

Sku Code: T3210

Ellipsometry is an optical surface analysis technique, based on the polarization state change of the light after reflection on the plane of a sample surface. A set of equipment has been designed to allow you to introduce the principle and applications of this technique increasingly used in the world of industry.

The purpose of the proposed construction is to assemble and set a didactic ellipsometer and perform many actions: determination of optical constants (refractive index, absorption index ...), measuring the thickness of thin layers of different samples.

An approach to uncertainties and measurement errors is also discussed.

 

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