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Diffraction Practical

Sku Code: T6132

This bench allows comprehensive diffraction(cracks, holes and son)  and interferences experiments (double slots and double holes) with laser.The Basix bench is equipped with a laser source at 532 nm giving very visible figures. The presented Ovisio sensor can complete this equipment.

Basix bench  2m + 2 single carriers
Lateral adjustment carrier +/- 30mm
Source green laser 532nm class II (1mw)
Power supply 3V - 3.3V DC (supplied transformer)
Screen 15x15 cm plastic with a grid face

Components mounted on the support
Token slots 7 and 7 son
Token with 3 pairs of Young slits
Token with single and double holes, square